Saki has 2D AOI inspection systems BF-Planet-XII for every size company and every need, whether it’s an offline, online, single lane, dual lane, XL, benchtop, a system that can run double-sided boards simultaneously, or anything in between.
SAKI BF-PLANET XII In-line 2D AOI systems employ a telecentric lens optical system to capture the clearest images. The system corrects for the brightness of the entire sample and compensates for position misalignment in real-time while the image is scanned, assuring inspection results that are accurate, reliable, and repeatable over time. A variety of algorithms and lighting types are available to deal with a wide range of industry inspection requirements. Multiple data handling capabilities are provided, such as switching settings by barcode reading and data output to the customer’s data server to flexibly cope with line requirements.
SAKI BF-Planet-XII 2D Inline AOI
Vintage: Year 2013
PCB Direction: Left to Right
Condition: Refurbished, working
Missing Parts: No
Warranty: 6 Months after instllation
Lead time: 7 Days
SMT AOI/SMD AOI/SMT AOI Machine SAKI BF-Planet-XII 2D
BF-Planet-XII has an alternate scanning system independently developed by Saikai, which can acquire multiple illumination images in one scan. The newly developed color capture system doubles the scanning speed of previous models. It only takes 9 seconds to scan M-type substrates (250x330mm), and at the same time realizes high-speed inspection of small parts such as 0603, greatly reducing the total operation time including inspection.
The new user interface is pre-installed with the Saikai standard library, which makes the setting of inspection data easier. The optional new function KPK can automatically find out the difference between the surface of the substrate when it is empty and when it is mounted, and simplifies the programming and detection process of missing parts, thereby shortening the preparation time required to start production. Inspect solder condition with coaxial overhead lighting. Inspection results are not affected by shadows from surrounding tall components, allowing the same data to be obtained anywhere on the substrate. At the same time, taking advantage of the linear full-board scanning method, only one inspection window is needed to detect all additional components on the entire substrate.
BF-Planet-XII also has real-time SPC information function, which can provide strong support for quality management and can greatly improve the yield. In combination with analysis and management support systems such as BF-Editor/BF-RP1/BF-Monitor/BFView, it is possible to comprehensively manage defects during the inspection process, analyze and solve problems in the manufacturing process.